Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...
Testing multiple devices at the same time is not providing the equivalent reduction in overall test time due to a combination of test execution issues, the complexity of the devices being tested, and ...
SAN FRANCISCO — During the Semicon West trade show, Agilent, Credence and Electroglas separately rolled out automatic test equipment (ATE) solutions to attack chip-testing costs. Electroglas Inc.
A few years ago, the semiconductor lingo for automated test equipment (ATE) PCBs was “load boards.” But more recently, they’ve become increasingly known in semiconductor parlance as “device interface ...
The increasing number of power domains found in power management ICs (PMICs) targeted for portable applications places heavy demands on the few precision DC resources found in many ATE systems. Even ...
An effective semiconductor test strategy extends from individual test cells comprising ATE systems, wafer probers, test contactors, and handlers up to supply-chain-wide software tools that can analyze ...
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