IC designers now have a powerful weapon in the struggle against rising test costs: commercially available EDA solutions that provide fast and effective means to implement scan compression on-chip. By ...

Santa Cruz, Calif. — Think your "smart" credit cards are safe from hackers, that your company firewall is secure and that no one can steal the intellectual property in your latest chip design? Think ...

Make all clocks and asynchronous resets come from chip pins during scan mode. Ensure that all scan elements on a scan chain are in the same clock domain. Know the requirements and limitations of your ...

Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...

For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...

How to run a basic vulnerability scan on your data center Linux servers with Nessus Your email has been sent Nessus is one of those tools every network, system and security admin should have at the ...

For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...