Semiconductor Engineering

Multi-Die Assemblies Require More Detailed Test Plan Earlier

Understanding connectivity issues and interactions are only part of the problem; ECOs can cause unexpected problems in other ...
Electronic Design

Design-For-Test The Smart Way: dFT With A "Big T" And A "Little d"

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Semiconductor Engineering

Building Bridges: A New DFT Paradigm

Over the last twenty years, structural testing with scan chains has become pervasive in chip design methodology. Indeed, it’s remarkable to think that most electronic devices we interact with today ...
EDN

DFT software tackles test costs

BALTIMORE — The marriage of design-for-test (DFT) software with test hardware may drastically lower the cost of test, according to several companies that will present their plans at this week's ...