The Fabricator

Using acoustic sensing and AI to detect MIG welding defects

The founding team of CEO Sophia Millar, Chief Technical Officer George Hallo, and Chief Product Officer Hooman Piroux ...
Hosted on MSN

Cutting-edge imaging and faster algorithms for finding minuscule defects in semiconductor chips

A defect in a semiconductor chip may be smaller than a human hair but can create big problems in your everyday life, from crippling your car's steering to making your laptop more susceptible to ...
Semiconductor Engineering

Nearly Invisible: Defect Detection Below 5nm

Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...
Semiconductor Engineering

Review of Automatic EM Image Algorithms for Semiconductor Defect Inspection (KU Leuven, Imec)

A new technical paper titled “Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review” was published by researchers at KU Leuven and imec. “In this ...
EurekAlert!

Researchers use machine learning to detect defects in additive manufacturing

Longitudinal (top) and axial (middle) images of X-Ray CT data of parts with 6 internal defects: a spherical clog, a stellated shaped clog, a cone shaped void, a blob shaped void, an elliptical warp of ...
NextBigFuture

Robust Error Detection to Enable Commercial Ready Quantum Computers from Quantum Circuits

I, Brian Wang, interviewed Andrei Petrenko, Head of Product at Quantum Circuits and Neil Wu Becker, Head of Marketing for Quantum Circuits. Quantum Circuits presented at Q2B 2024 Silicon Valley at the ...
EurekAlert!

Optical wafer defect inspection at the 10 nm technology node and beyond

Defect inspection scientists from Huazhong University of Science and Technology, Harbin Institute of Technology and The Chinese University of Hong Kong make a thorough review of new perspectives and ...