Part four explains how to use breakpoints, event triggers, and program traces to debug code. Part six reviews the common bugs found in DSP applications, and outlines the different testing methods ...

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

The tips and tricks when testing motor-driver ICs on the lab bench can help engineers reduce time spent on evaluating and prototyping motor systems. The first installment of this two-part article ...