ABERDEEN PROVING GROUND, MD – In October 2023, the U.S. Army Test and Evaluation Command (ATEC) demonstrated a Multi-Domain Operations Distributed Live, Virtual, Constructive (LVC) Initial Operational ...

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...

As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...

Semiconductor devices now anchor the world’s most demanding infrastructures—from hyperscale data centers to advanced automotive platforms and industrial control systems. At scale, even rare faults can ...