With the aim of accelerating yield ramps of deep sub-micron semiconductors by speeding root cause analysis of defects to give better control over advanced processes, reduced time-to-market, and lower ...

Korean researchers have developed a new analysis method capable of detecting “hidden defects” in semiconductors with a ...

Pipeline defect analysis and assessment remains a critical area of research, given its direct impact on the safety and reliability of energy transportation infrastructures. Mechanical defects such as ...

The Atomic Force Microscope (AFM) has evolved from an extremely high resolution scientific research instrument into a highly accurate metrology tool. This evolution has broadened the role of the AFM ...

Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...

Venice, Florida &#8212 SoftJin, introduced NxDAT, a tool for the analysis of defects identified by mask inspection systems. The software includes features for defect navigation, visual display, defect ...

According to news reports, Samsung and TSMC are expected to enter 5nm process mass production in 2020. The competition in 5nm wafer yield and market share will be very intense. A brand new wafer ...

Metrology is the science of measuring, characterizing, and analyzing materials. Within metrology, there are several technologies used to detect material defects on a very small scale – precision on ...

In addition to surface and subsurface defects, residual stress represents a concern. Over time, these stress points, ...

Modern advanced packaging processes and shrinking semiconductor device sizes mean that it is vital to consistently eliminate sub-20 nm defects and surface contaminants. To do this effectively, the ...