When trying to measure molecular structures with nanometer precision, every bit of noise shows up in the data: someone walking past the microscope, tiny vibrations in the building and even the traffic ...

A new technical paper titled “Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review” was published by researchers at KU Leuven and imec. “In this ...

In a recent study published in the journal NPJ Digital Medicine, researchers have developed a deep learning algorithm capable of analyzing high-resolution images of retinal vasculature to detect ...