Logic BIST (LBIST) is a well-stablished traditional solution for meeting automotive testing standards. However, using pseudo-random LBIST patterns can be challenging when trying to achieve ...

While semiconductor design engineers become more aware of silent data corruption (SDC) or silent data errors (SDE) caused by aging, environmental factors, and other issues, embedded test solutions are ...

A unique investment from the quant trading giant signals a shift in how complex systems will be tested. Software systems have grown more complex, and as AI accelerates the volume of code being ...

ATI Technologies Inc. reported that it has implemented an embedded deterministic test (EDTTM) tool from Mentor Graphics Corp. in the testing of a new 90nm graphics processor. The Modular TestKompress ...

Recent and continuing trends in the semiconductor industry pose challenges to IC test-data volumes, test application times, and test costs. The industry has thus far succeeded in containing test costs ...

It should come as no surprise that Moore's Law of regularly doubling chip capacity is having an impact on automatic test equipment (ATE) for ICs. ATE, of course, applies patterns of signals and checks ...

Semiconductor testing is undergoing multiple paradigm changes at once with the common goals of producing more known good die per month with low test cost. Achieving these goals requires a delicate ...

Testing APIs and applications was challenging in the early devops days. As teams sought to advance their CI/CD pipelines and support continuous deployment, test automation platforms gained popularity, ...

A unique investment from the quant trading giant signals a shift in how complex systems will be tested. TYSONS CORNER, Va., Dec. 3, 2025 /PRNewswire/ -- Antithesis today announced a $105 million ...