Logic BIST (LBIST) is a well-stablished traditional solution for meeting automotive testing standards. However, using pseudo-random LBIST patterns can be challenging when trying to achieve ...
Given the highly infectious nature of the COVID pathogen, tests for the virus had to be quick, reliable and safe. The test ...
A unique investment from the quant trading giant signals a shift in how complex systems will be tested. Software systems have grown more complex, and as AI accelerates the volume of code being ...
While semiconductor design engineers become more aware of silent data corruption (SDC) or silent data errors (SDE) caused by aging, environmental factors, and other issues, embedded test solutions are ...
ATI Technologies Inc. reported that it has implemented an embedded deterministic test (EDTTM) tool from Mentor Graphics Corp. in the testing of a new 90nm graphics processor. The Modular TestKompress ...
Semiconductor testing is undergoing multiple paradigm changes at once with the common goals of producing more known good die per month with low test cost. Achieving these goals requires a delicate ...
A unique investment from the quant trading giant signals a shift in how complex systems will be tested. TYSONS CORNER, Va., Dec. 3, 2025 /PRNewswire/ -- Antithesis today announced a $105 million ...
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