A new technical paper titled “Aging Aware Steepening of the Fault Coverage Curve of a Scan Based Transition Fault Test Set” ...
The ScanExpress boundary-scan tool suite version 7.8 includes improved cluster testing support, intelligent BSDL file handling, and a model-based test coverage. The suite also expands JTAG Embedded ...
When it comes to semiconductor device testing, the primary goal is to ensure that each device meets functional and performance specifications. Testing also plays a crucial role in confirming that ...
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