This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer.

In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...

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Researchers say the innovation, known as SmartEM, will speed scanning sevenfold and open the field of connectomics to a ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...

What is High-Resolution Transmission Electron Microscopy (HRTEM)? High-resolution transmission electron microscopy (HRTEM) is an advanced imaging technique that enables the direct visualization of ...

Among all the instruments in its class, the Thermo Scientific Prisma E Scanning Electron Microscope (SEM) offers the most comprehensive solution, thanks to its sophisticated automation and extensive ...

A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...

A unique laboratory at Michigan Tech captured microscopic photography of snowflakes in a demonstration of the lab's high-powered scanning electron microscope. The Applied Chemical and Morphological ...

Researchers at the University of Illinois at Urbana-Champaign have shown for the first time that expensive aberration-corrected microscopes are no longer required to achieve record-breaking ...