To compete in the fast-growing market for automotive ICs, semiconductor companies need to address new challenges across the entire design flow. To meet the ISO 26262 goal of zero defective parts per ...

A complete test plan includes testing the logic and all memories. That is, until the boss adds, “Oh, by the way, the DFT guy left the company, so you also get to do the test stuff. Choose any tools ...

In the real world, we are slaves to our environment. The decisions we make are dependent on the resources available at any given time. In school, I remember coming up with a binary decision diagram ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

Leading automotive semiconductor suppliers successfully deploy Synopsys' synthesis-based test solution to meet their stringent test goals for higher levels of quality, reliability and functional ...

Recent and continuing trends in the semiconductor industry pose challenges to IC test-data volumes, test application times, and test costs. The industry has thus far succeeded in containing test costs ...