This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer.
The JEOL 1400 High Contrast Transmission Electron Microscope is a state-of-the-art imaging system designed for high-resolution transmission electron microscopy (TEM). This microscope features advanced ...
Thought LeadersDr. Craig Johnson & Dr. Kate VanderburghDirector of Research Core Facilities & SEM/X-ray Microscopy ManagerDrexel University AZoMaterials speaks with Dr. Craig Johnson, Director of ...
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