KLA leverages cutting-edge semiconductor inspection tech, partnering with industry leaders like TSMC and Samsung. This positions them to capitalize on the growing demand for 2nm and 3nm chip ...

Each of the inspection systems in the new portfolio features seamless connectivity to the recently introduced eDR-7000 e-beam wafer defect review system. With outstanding sensitivity and review speed, ...

Metrology giant KLA-Tencor Inc. says it has developed darkfield inspection technology that approaches the sensitivity and throughput of brightfield technology. The San Jose-based metrology giant today ...

SAN JOSE: KLA-Tencor today introduced the Puma 9150 system, the company's latest advancement in darkfield patterned wafer inspection technology, featuring new optical modes that enable capture of a ...

SAN JOSE , USA: KLA-Tencor has introduced the eDR-5200, a new-generation wafer defect review and classification system that leverages advances in resolution and defect re-detection sensitivity, along ...

SAN FRANCISCO, July 7, 2014 /PRNewswire/ -- Today at SEMICON West, KLA-Tencor Corporation (NASDAQ: KLAC) announced four new systems-the 2920 Series, Puma' 9850, Surfscan® SP5 and eDR'-7110-that ...