This is accomplished by connecting all of the design's registers in serial fashion, allowing test engineers to shift data in and out through a few ports at the chip level (Fig. 1). That allows, for ...
Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...
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