Prasad Banala is the Head of Site Reliability Engineering (SRE), Quality Assurance, and Performance Engineering at a major retail company. Advanced robotic automation technologies, combined with the ...

System-level testing is becoming essential for testing complex and increasingly heterogeneous chips, driven by rising demand for reliable parts in safety- and mission-critical applications. More and ...

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...

A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip” was published by researchers at Inha University and Teradyne. ...

Electronic control units (ECUs) are vital embedded systems in vehicles; as such they impact numerous functions in a car and therefore must undergo rigorous testing. In any test workflow, ...