Compact, modular system with integrated multi-test capability and up to 20-core parallel testing for high-volume efficiency Keysight Technologies, Inc. (NYSE: KEYS) introduces the next generation of ...

Testing multiple devices in parallel using the same ATE results in reduced test time and lower costs, but it requires engineering finesse to make it so. Minimizing test measurement variation for each ...

Time is money in electronics, as in other industries, and the more time that is invested in testing chips means more costs being added to the product in question. To speed up testing for memory ...

It seems simple. If you want to cut the cost of test for an IC, you should double or even quadruple the number of devices you test in parallel. After all, memory manufacturers have proven the value of ...