EDN

Decreasing the Cost of Test with Automatic Test Pattern Generation

Success in the electronics business hinges on producing high-quality products and using the most cost-effective methods to do so. As the number of devices on integrated circuits continues to double ...
Electronic Design

What’s The Difference Between Scan ATPG And IJTAG Pattern Retargeting?

Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...
EDN

Magma Unveils Talus ATPG and Talus ATPG-X – Expands Design-for-Test Capabilities with

Bangalore, Oct. 22, 2007 – Magma Design Automation Inc. (Nasdaq: LAVA), a provider of chip design software, today unveiled Talus® ATPG and Talus ATPG-X with on-chip compression. These advanced ...
Design-Reuse

Faster and Fewer Patterns with Breakthrough ATPG to the Rescue

New semiconductor technologies like FinFETs are giving rise to new types of fault effects not covered by standard stuck-at and at-speed tests. Automatic test pattern generation (ATPG) tools perform ...
Electronic Design

What’s The Difference Between ATPG And Logic BIST?

Two test strategies are used to test virtually all IC logic: automatic test pattern generation (ATPG) with test pattern compression and logic built-in self-test (BIST). This article will describe how ...
Semiconductor Engineering

Advances in ATPG: From Power and Timing Awareness to Intelligent Pattern Search with AI

This website uses cookies to improve your experience while you navigate through the website. The cookies that are categorized as necessary are stored on your browser as they are essential for the ...
Semiconductor Engineering

Power-Aware Test Vector Porting For Production ATE

Power management in contemporary system-on-chip (SoC) designs is almost unimaginably complex. Processors and other chip cores turn on and off as needed. Advanced features such as dynamic voltage and ...