EDN

Process variation: you can’t ignore statistics any more

I like to say that “you can’t ignore the physics any more” to point out that we have to worry about lots of physical effects that we never needed to consider. But “you can’t ignore the statistics any ...
isixsigma on MSN

The Power of Special Cause Variation: Learning from Process Changes

Special cause variation, I love to see it! That’s because I know I’m about to learn something important about my process. A ...
Semiconductor Engineering

Process Corner Explosion

The number of corners that need to be checked is exploding at 7nm and below, fueled by everything from temperature and voltage to changes in metal. Lowering risk and increasing predictability of an ...
Semiconductor Engineering

Process Variation Analysis Of Device Performance Using Virtual Fabrication — Methodology Demonstrated On A CMOS 14-nm FinFET Vehicle

A new methodology to assess the impact of fabrication inherent process variability on 14-nm fin field effect transistor (FinFET) device performance. August 18th, 2021 - By: Coventor A new methodology ...