Integrated circuit complexity and integration continuously advances, posing challenges to the development process. Market profitability, however, demands that products be designed and produced as fast ...

Present-day System-on-Chips consist of a number of clock domains with different functional sources. Without lockup elements, it would have been impossible to stitch together all these in a single scan ...

This in-depth discussion of scan-based testing explores the benefits, implementation, and possible problems of AC scan. Today�s large, complex chips present an entirely new set of test issues for ...

It should come as no surprise that Moore's Law of regularly doubling chip capacity is having an impact on automatic test equipment (ATE) for ICs. ATE, of course, applies patterns of signals and checks ...