Scanning electron microscopy (SEM), along with key analytical techniques, such as energy dispersive spectroscopy (EDS) and electron backscatter diffraction (EBSD), are essential for advanced materials ...
A focused ion beam scanning electron microscope (FIB-SEM) equipped with a compact time-of-flight secondary ion mass spectrometer (ToF-SIMS) 1,2 and traditional energy dispersive X-ray spectroscopy ...
Assessing the chemical makeup of a medical device as part of the safety evaluation can either be a blessing for manufacturers by shortening the time to market or entail some surprises, according to ...
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