AZoOptics

Advancing Surface Metrology Through Portable 3D Optical Inspection

Portable 3D optical inspection with 4Di InSpec transforms surface metrology, enhancing defect detection and quality assurance ...
AZoOptics

Fast 3D Defect and Surface Roughness Measurement for Manufacturing Quality Control

Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...
AZOM

Defect Measurement with the 4D InSpec Surface Gauge

Two questions asked in this paper were: is the measurement by 4D InSpec equivalent on the original surface in respect to a replica, that is, how similar are the results? And: under what circumstances ...
Semiconductor Engineering

Open-Short Normalization Method For A Quick Defect Identification In Branched Traces With High-Resolution Time-Domain Reflectometry

Open-Short Normalization Method For A Quick Defect Identification In Branched Traces With High-Resolution Time-Domain Reflectometry An open-short normalization (OSN) method eliminates ...
EurekAlert!

KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity

Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...