[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...

While most countries have switched to digital broadcasting, and most broadcasts themselves have programming on 24/7 now, it’s hard to remember the ancient times of analog broadcasts that would ...

Patterns created using advanced fault models provide higher test coverage, improved defect detection, and higher-yielding ...

Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...