The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...

As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...

Can you please introduce yourself and tell us about your background in process safety testing? My name is John Weaver. I earned a bachelor's degree in chemistry from Penn State University many years ...

The Colorado Bureau of Investigation announced the findings on Friday of an internal affairs investigation into a former CBI DNA scientist who has been accused of data manipulation of DNA test results ...

The software testing landscape is undergoing a seismic shift. For years, continuous automation testing (CAT) platforms have been the gold standard for reducing manual testing and ensuring ...