A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip” was published by researchers at Inha University and Teradyne. ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Vivek Yadav, an engineering manager from ...

High Voltage, Inc. is an American test equipment manufacturing company located in rural Copake, New York. The company’s HPA line of ac testers are available with outputs up to 300 kV ac and power ...

Achieving autonomous driving safely requires near endless hours of training software on every situation that could possibly arise before putting a vehicle on the road. Historically, autonomy companies ...