(Nanowerk News) Turning up the intensity of x-ray beams used to probe the atomic structures of materials can actually reduce the intensity of x-rays scattered from the material, a RIKEN-led team has ...
Fig.2 Crystal structure characterization of tin perovskites films. (a) GIWAXS patterns of PEABr and PEABr-PEASCN films. (b) GIWAXS intensity integrated azimuthally. (c) XRD patterns of tin perovskite ...
Ishikawa, Japan-- X-ray diffraction (XRD) is an experimental technique to discern the atomic structure of a material by irradiating it with x-rays at different angles. Essentially, the intensity of ...
With the development of different techniques for the synthesis of nanomaterials, researchers are constantly looking for a more precise instrument for their nanoscale characterization. X-ray ...
A new research study from Opto-Electronic Advances discusses tailoring electron vortex beams with customizable intensity patterns by electron diffraction holography. In recent years, the scientific ...