Provide practical KPIs to monitor, including FA hit rate (percent of FAs that find root cause) and time to address yield ...

Identifying issues that actually affect yield is becoming more critical and more difficult at advanced nodes, but there is progress. Although they are closely related, yield management and process ...

STEINHAGEN, Germany, Nov. 12, 2025 /PRNewswire/ -- As demand for high-performance power electronics continues to rise across automotive, industrial, and data center applications, manufacturers are ...

Yield improvement at sub 100-nm technologies relies on the latest scan test techniques. As IC feature sizes shrink below 90 nm, in-line inspection techniques to determine yield-limiting problems ...