Diagnosis-driven yield analysis identifies the cause of systematic yield loss to speed yield ramp on new processes and improves yield on mature processes. Finding the root cause of yield loss is ...

Identifying issues that actually affect yield is becoming more critical and more difficult at advanced nodes, but there is progress. Although they are closely related, yield management and process ...

Key market opportunities in semiconductor wafer inspection equipment include the scaling of semiconductor nodes, rising ...

Failure analysis (FA) is an essential step for achieving sufficient yield in semiconductor manufacturing, but it’s struggling to keep pace with smaller dimensions, advanced packaging, and new power ...

Yield improvement at sub 100-nm technologies relies on the latest scan test techniques. As IC feature sizes shrink below 90 nm, in-line inspection techniques to determine yield-limiting problems ...

As integrated circuits grow in content and complexity, reaching target yield levels becomes challenging. A product engineer's worst nightmares frequently become reality: sample devices are supposed to ...

A recent review article published in Advanced Materials explored the potential of artificial intelligence (AI) and machine learning (ML) in transforming thermoelectric (TE) materials design. The ...

In recent years, significant advancements in ML have influenced several fields beyond computer science, including autonomous driving, structural color design, medicine, and face recognition. The ...

Drug companies want to make products as quickly and efficiently as possible. The faster and more cheaply a medicine can be manufactured, packaged, and brought to market, the higher its revenue ...