A technical paper titled “Accelerating Defect Predictions in Semiconductors Using Graph Neural Networks” was published by researchers at Purdue University, Indian Institute of Technology (IIT) Madras, ...

Scientists used Lorentz transmission electron microscopy (LTEM) to visualize topological defects. They were able to do so by passing electrons and observing their deflections through a thin magnetic ...

This paper reviews the research progress of layered double hydroxide (LDH) with various types of defects and its regulation strategies in recent years. Furthermore, the relationship between the ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...

There is an expectation from consumers that today’s electronic products will just work and that electronic manufacturers have continued to improve the quality of their products. In most cases, this ...