Dutch chip gear maker ASML has lifted the kimono its Twinscan XT:260, a new lithography scanner built for the brave new world of 3D chip packaging. The outfit claims that it is the first machine of ...
New Imaging Technologies (NIT), a leading French manufacturer of InGaAs SWIR sensors and cameras, announces the launch of the LiSaSWIR 2048 v2, a high-performance upgrade of its line-scan SWIR camera ...
Abstract: A defective through-silicon via (TSV) may cause a small delay fault that is difficult to detect using conventional logic testing methods. Testing TSVs used for chip-to-chip interconnection ...
We introduce InterAct, a comprehensive large-scale 3D human-object interaction (HOI) dataset, originally comprising 21.81 hours of HOI data consolidated from diverse sources, the dataset is ...
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School of Materials Science and Engineering, Chongqing Jiaotong University, Chongqing 400074, P. R. China ...
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