Deep-learning algorithms enhance mutation detection in cancer and RNA sequencing

Researchers from the Faculty of Engineering at The University of Hong Kong (HKU) have developed two innovative deep-learning ...
Semiconductor Engineering

Using Deep Learning ADC For Defect Classification For Automatic Defect Inspection

In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...