Semiconductor Engineering

Using Deep Learning ADC For Defect Classification For Automatic Defect Inspection

In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...
Frontiers

Deep Learning for Medical Imaging Applications

Artificial Intelligence (AI) is revolutionizing the dynamics of technological advancement in the field of medical imaging, ...
Frontiers

AI and Imaging for Oral Cancer Diagnosis and Prognosis

The integration of artificial intelligence (AI) with imaging has emerged as a transformative force in the field of oral oncology. Oral cancer remains a ...
Scientific Research Publishing

Boosting Algorithm: An Ensemble Learning Tool for Land Use Land Cover Classification Using Google Alpha Earth Foundations Satellite Embeddings ()

An Ensemble Learning Tool for Land Use Land Cover Classification Using Google Alpha Earth Foundations Satellite Embeddings ...