Tech Xplore

Mistaken correlations: Why it's critical to move beyond overly aggregated machine-learning metrics

MIT researchers have identified significant examples of machine-learning model failure when those models are applied to data ...
IEEE

Spatial Modeling with Automated Machine Learning and Gaussian Process Regression Techniques for Imputing Wafer Acceptance Test Data

Abstract: The Wafer Acceptance Test (WAT) is a significant quality control measurement in the semiconductor industry. However, because the WAT process can be time-consuming and expensive, sampling ...
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A kid built a machine to solve a problem adults ignored

These inventions weren’t built in laboratories or classrooms. They started with simple observations, small frustrations, and curiosity. Using basic materials, these kids created devices that solve ...
IEEE

Heart Disease Identification Using Machine Learning Algorithm

Abstract: After all advancements in technology and times, prediction and prevention of heart diseases is still a major issue in modern days. Heart diseases play a major role in high death rate in ...