Wafer breakage is the most serious impact of killer crystalline defects. About 0.1 to 0.2% of silicon wafers break. The higher the number of wafer breakages, the slower the time to market. Given the ...
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“Wafer mass metrology has become increasingly important as semiconductor processes have become more complex and sensitive,” said Microtronic CEO Reiner Fenske in making the announcement. “Today’s fabs ...
Professor Richard Curry and the Platform for Nanoscale Advanced Materials Engineering tool used to place single atoms of tin into diamond.University of Manchester A novel fabrication approach ...
This PoC assumes that you are running your Kafka cluster in Kubernetes, using either the Strimzi Kafka Operator or IBM Event Streams. The annotations include a timestamp for the Prometheus data so it ...
Between September and January, six Google Pixel smartphones hitched free rides on four New York City subway cars. Specifically, they took the A train, as it ping-ponged the 32 miles between the ...
A technical paper titled “Detection of defective chips from nanostructures with a high-aspect ratio using hyperspectral imaging and deep learning” was published by researchers at Samsung Electronics.
Abstract: This paper presents a novel anomaly detection framework for rail systems, integrating zero-shot texture analysis and regression-based deformation recognition to monitor rail defects ...
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