The test economics of state-of-the-art smartphones, tablets and routers demand highly parallel RF test. We are addressing this next wave in RF communications test, enabled by Wi-Fi 6E, operating in ...

There is considerable ongoing discussion on how to contain exponentially increasing test costs for systems-on-chip (SoCs) and microprocessors. As the transistor geometry shrinks and more transistors ...

Testing multiple devices at the same time is not providing the equivalent reduction in overall test time due to a combination of test execution issues, the complexity of the devices being tested, and ...

http://www.tektronix.comFor decades, parallel bus architectures have been the most common means of transporting digital signals around a system. Now that system data ...