A relatively simple statistical analysis method can more accurately predict the risk of landslides caused by heavy rain, ...
A new research paper shows the approach performs significantly better than the random-walk forecasting method.
Abstract: The Wafer Acceptance Test (WAT) is a significant quality control measurement in the semiconductor industry. However, because the WAT process can be time-consuming and expensive, sampling ...
Abstract: In today’s digital era, where information flows seamlessly and is readily available and accessible. However, these information and communication systems are highly dependent on the ...
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